• DocumentCode
    3064369
  • Title

    High speed and continuous 3-D measurement system

  • Author

    Araki, K. ; Shimizu, M. ; Noda, T. ; Chiba, Y. ; Tsuda, Y. ; Ikegaya, K. ; Sannomiya, K. ; Gomi, M.

  • Author_Institution
    Sch. of Comput. & Cognitive Sci., Chukyo Univ., Japan
  • fYear
    1992
  • fDate
    30 Aug-3 Sep 1992
  • Firstpage
    62
  • Lastpage
    65
  • Abstract
    A new system for high speed and continuous 3-D measurement is presented. It is based on the slit-ray projection method. Remarkable features of the system-high speed and continuous measurement-mainly result from its image plane constructed by a PSD array which is horizontally non-divided and linear, but vertically divided in numbers. All row PSD elements are attached to respective analog signal processors; analog signals are digitized through A/D converters and stored in memory elements in order. By the virtue of this image plane configuration basic data for 3-D measurement are acquired during only one scanning of the slit-ray at high speed in the form of addresses of the memory elements and data stored in them. Moreover, using large capacity and/or dual port memories, one may continuously obtain 3-D range data of as many scenes as one wants. A trial system has been implemented using a newly designed PSD array of 128 channels and it has verified the method, obtaining 3-D range data at video rates continuously in an accuracy within ±0.3%
  • Keywords
    image processing equipment; image sensors; position measurement; 3-D measurement; 3D range data; PSD array; analog signal processors; continuous measurement; data acquisition; high speed; image plane; position sensitive device; slit-ray projection; video rates; Application software; Art; Computer vision; Data acquisition; Layout; Radio access networks; Robot vision systems; Signal processing; Stereo vision; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1992. Vol. IV. Conference D: Architectures for Vision and Pattern Recognition, Proceedings., 11th IAPR International Conference on
  • Conference_Location
    The Hague
  • Print_ISBN
    0-8186-2925-8
  • Type

    conf

  • DOI
    10.1109/ICPR.1992.202130
  • Filename
    202130