• DocumentCode
    3064796
  • Title

    Training-symbol embedded, high-rate complex orthogonal designs for relay networks

  • Author

    Harshan, J. ; Rajan, B. Sundar ; Hjørungnes, Are

  • Author_Institution
    Dept. of ECE, Indian Inst. of Sci., Bangalore, India
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    2233
  • Lastpage
    2237
  • Abstract
    Distributed Space-Time Block Codes (DSTBCs) from Complex Orthogonal Designs (CODs) (both square and non-square CODs other than the Alamouti design) are known to lose their single-symbol ML decodable (SSD) property when used in two-hop wireless relay networks using the amplify and forward protocol. For such a network, a new class of high rate, training-symbol embedded (TSE) SSD DSTBCs are proposed from TSECODs. The constructed codes include the training symbols within the structure of the code which is shown to be the key point to obtain high rate along with the SSD property. TSE-CODs are shown to offer full-diversity for arbitrary complex constellations. Non-square TSE-CODs are shown to provide better rates (in symbols per channel use) compared to the known SSD DSTBCs for relay networks when the number of relays is less than 10. Importantly, the proposed DSTBCs do not contain zeros in their codewords and as a result, antennas of the relay nodes do not undergo a sequence of switch on and off transitions within every codeword use. Hence, the proposed DSTBCs eliminate the antenna switching problem.
  • Keywords
    block codes; decoding; protocols; radio networks; space-time codes; DSTBC; amplify and forward protocol; complex orthogonal design; distributed space-time block codes; relay nodes; single-symbol ML decodable; training symbols; two-hop wireless relay networks; Block codes; Broadcasting; Delay; MIMO; Maximum likelihood decoding; Relays; Signal processing; Switches; Wireless application protocol; Wireless networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513491
  • Filename
    5513491