• DocumentCode
    3065476
  • Title

    Statistical mechanical analysis of a typical reconstruction limit of compressed sensing

  • Author

    Kabashima, Yoshiyuki ; Wadayama, Tadashi ; Tanaka, Toshiyuki

  • Author_Institution
    Dept. of Comput. Intell. & Syst. Sci., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1533
  • Lastpage
    1537
  • Abstract
    We use the replica method of statistical mechanics to examine a typical performance of correctly reconstructing N-dimensional sparse vector x = (xi) from its linear transformation y = Fx of P dimensions on the basis of minimization of the Lp-norm ∥x∥p = lim∈→+0 ΣNi=1 |xi|p+∈. We characterize the reconstruction performance by the critical relation of the successful reconstruction between the ratio α = P/N and the density ρ of non-zero elements in x in the limit P, N → ∞ while keeping α ~ O(1) and allowing asymptotically negligible reconstruction errors. We show that the critical relation αc(ρ) holds universally as long as FT F can be characterized asymptotically by a rotationally invariant random matrix ensemble and FFT is typically of full rank. This supports the universality of the critical relation observed by Donoho and Tanner (Phil. Trans. R. Soc. A, vol. 367, pp. 4273-4293, 2009; arXiv: 0807.3590) for various ensembles of compression matrices.
  • Keywords
    signal reconstruction; sparse matrices; statistical analysis; N-dimensional sparse vector reconstruction; asymptotically negligible reconstruction errors; compressed sensing reconstruction; compression matrices; linear transformation; nonzero elements density; rotationally invariant random matrix; statistical mechanical analysis; Compressed sensing; Computational efficiency; Computational intelligence; Computer science; Minimization methods; Optimization methods; Performance analysis; Polynomials; Random variables; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513526
  • Filename
    5513526