DocumentCode
3065476
Title
Statistical mechanical analysis of a typical reconstruction limit of compressed sensing
Author
Kabashima, Yoshiyuki ; Wadayama, Tadashi ; Tanaka, Toshiyuki
Author_Institution
Dept. of Comput. Intell. & Syst. Sci., Tokyo Inst. of Technol., Yokohama, Japan
fYear
2010
fDate
13-18 June 2010
Firstpage
1533
Lastpage
1537
Abstract
We use the replica method of statistical mechanics to examine a typical performance of correctly reconstructing N-dimensional sparse vector x = (xi) from its linear transformation y = Fx of P dimensions on the basis of minimization of the Lp-norm ∥x∥p = lim∈→+0 ΣNi=1 |xi|p+∈. We characterize the reconstruction performance by the critical relation of the successful reconstruction between the ratio α = P/N and the density ρ of non-zero elements in x in the limit P, N → ∞ while keeping α ~ O(1) and allowing asymptotically negligible reconstruction errors. We show that the critical relation αc(ρ) holds universally as long as FT F can be characterized asymptotically by a rotationally invariant random matrix ensemble and FFT is typically of full rank. This supports the universality of the critical relation observed by Donoho and Tanner (Phil. Trans. R. Soc. A, vol. 367, pp. 4273-4293, 2009; arXiv: 0807.3590) for various ensembles of compression matrices.
Keywords
signal reconstruction; sparse matrices; statistical analysis; N-dimensional sparse vector reconstruction; asymptotically negligible reconstruction errors; compressed sensing reconstruction; compression matrices; linear transformation; nonzero elements density; rotationally invariant random matrix; statistical mechanical analysis; Compressed sensing; Computational efficiency; Computational intelligence; Computer science; Minimization methods; Optimization methods; Performance analysis; Polynomials; Random variables; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-7890-3
Electronic_ISBN
978-1-4244-7891-0
Type
conf
DOI
10.1109/ISIT.2010.5513526
Filename
5513526
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