DocumentCode
3067059
Title
Separating leaves from trunks and branches with dual-wavelength terrestrial lidar scanning
Author
Zhan Li ; Douglas, Ewan ; Strahler, Alan ; Schaaf, Crystal ; Xiaoyuan Yang ; Zhuosen Wang ; Tian Yao ; Feng Zhao ; Saenz, Edward J. ; Paynter, Ian ; Woodcock, Curtis E. ; Chakrabarti, Subit ; Cook, Tom ; Martel, Jesus ; Howe, Glenn ; Jupp, David L. B. ; C
Author_Institution
Dept. of Earth & Environ., Boston Univ., Boston, MA, USA
fYear
2013
fDate
21-26 July 2013
Firstpage
3383
Lastpage
3386
Abstract
Terrestrial laser scanning combining both near-infrared (NIR) and shortwave-infrared (SWIR) wavelengths can readily distinguish broad leaves from trunks, branches, and ground surfaces. Merging data from the 1548 nm SWIR laser in the Dual-Wavelength Echidna® Lidar (DWEL) instrument in engineering trials with data from the 1064 nm NIR laser in the Echidna® Validation Instrument (EVI), we imaged a deciduous forest scene at the Harvard Forest, Petersham, Massachusetts, and showed that trunks are about twice as bright as leaves at 1548 nm, while they have about equal brightness at 1064 nm. The reduced return of leaves in the SWIR is also evident in merged point clouds constructed from the two laser scans. This distinctive difference between leaf and trunk reflectance in the two wavelengths validates the principle of effective discrimination of leaves from other targets using the new dual-wavelength instrument.
Keywords
geophysical techniques; infrared imaging; optical radar; vegetation; DWEL instrument; Dual-Wavelength Echidna Lidar instrument; EVI; Echidna Validation Instrument; Harvard Forest; Massachusetts; NIR laser; NIR wavelength; Petersham; SWIR laser; SWIR wavelength; USA; branches; broad leaves; data merging; deciduous forest scene image; dual-wavelength instrument; dual-wavelength terrestrial lidar scanning; engineering trials; ground surface; leaf discrimination; leaf reflectance; merged point clouds; near-infrared wavelength; shortwave-infrared wavelength; terrestrial laser scanning; trunk reflectance; wavelength 1064 nm; wavelength 1548 nm; Australia; Educational institutions; Instruments; Laser beams; Laser radar; Lasers; Scattering; Terrestrial lidar; leaves; near-infrared reflectance; shortwave infrared reflectance; trunks;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2013 IEEE International
Conference_Location
Melbourne, VIC
ISSN
2153-6996
Print_ISBN
978-1-4799-1114-1
Type
conf
DOI
10.1109/IGARSS.2013.6723554
Filename
6723554
Link To Document