• DocumentCode
    3073349
  • Title

    Newborn Screening System Based on Adaptive Feature Selection and Support Vector Machines

  • Author

    Hsieh, Sung-Huai ; Chien, Yin-Hsiu ; Shen, Chia-Ping ; Chen, Wei-Hsin ; Chen, Po-Hao ; Hsieh, Sheau-Ling ; Cheng, Po-Hsun ; Lai, Feipei

  • Author_Institution
    Inf. Syst. Office, Nat. Taiwan Univ. Hosp., Taipei, Taiwan
  • fYear
    2009
  • fDate
    22-24 June 2009
  • Firstpage
    344
  • Lastpage
    347
  • Abstract
    The clinical symptoms of metabolic disorders during neonatal period are often not apparent, if not treated early irreversible damages such as mental retardation may occur, even death. Therefore, practicing newborn screening is very important to prevent neonatal from these damages. In this paper, the newborn screening system used support vector machines (SVM) classification technique is proposed in place of cut-off value decision to evaluate the metabolic substances concentration raw data obtained from tandem mass spectrometry (MS/MS) and determine whether the newborn has some kinds of metabolic disorder diseases. On the basis of the proposed features, new analytic combinations are identified with superior discriminatory performance compared with the best published combinations. Classifiers built with the feature selection to find C3/C2, C3 and C16 of three key point features achieved diagnostic sensitivities, specificities and accuracy approaching 100%.
  • Keywords
    biochemistry; bioinformatics; classification; diseases; support vector machines; adaptive feature selection; classification technique; metabolic disorders; metabolic substances concentration; neonatal period; newborn screening system; support vector machines; tandem mass spectrometry; Adaptive systems; Biochemistry; Bioinformatics; Diseases; Hospitals; Machine learning; Pediatrics; Support vector machine classification; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and BioEngineering, 2009. BIBE '09. Ninth IEEE International Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-0-7695-3656-9
  • Type

    conf

  • DOI
    10.1109/BIBE.2009.72
  • Filename
    5211247