• DocumentCode
    3078633
  • Title

    Trigonometric method to handle realistic error probabilities in logic circuits

  • Author

    Yu, Chien-Chih ; Hayes, John P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We present a novel trigonometry-based probability calculation (TPC) method for analyzing circuit behavior and reliability in the presence of errors that occur with extremely low probability. Signal and error probabilities are represented by trigonometric functions controlled by their corresponding angles. By combining trigonometric identities and Taylor expansions, the effect of an error at a particular gate is simulated as a rotation. In addition, the correlations among signals caused by reconvergence are carefully handled. The TPC method is shown to be more scalable and accurate than prior approaches, especially for very low-probability errors. We measure the performance of TPC by applying it to the ISCAS and LGSyn-91 benchmark circuits. Experimental results show that TPC achieves near-linear runtime complexity even with the largest circuits, while the accuracy gradually increases with decreasing error probabilities.
  • Keywords
    error statistics; integrated circuit reliability; logic circuits; probability; TPC method; Taylor expansion; circuit behavior; circuit reliability; linear runtime complexity; logic circuit; realistic error probability; signal probability; trigonometric function; trigonometric identity; trigonometric method; trigonometry-based probability calculation; Accuracy; Correlation; Error probability; Integrated circuit modeling; Logic gates; Probabilistic logic; Error modeling; logic circuits; probabilistic analysis; reliability; soft errors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763019
  • Filename
    5763019