• DocumentCode
    3078936
  • Title

    Empirical design bugs prediction for verification

  • Author

    Guo, Qi ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji ; Wu, Yue ; Hu, Weiwu

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is to expose as many bugs as possible. In this paper, we propose a novel verification methodology that leverages the early bug prediction of a DUV to guide and assess related verification process. To be specific, this methodology utilizes predictive models built upon artificial neural networks (ANNs), which is capable of modeling the relationship between the high-level attributes of a design and its associated bug information. To evaluate the performance of constructed predictive model, we conduct experiments on some open source projects. Moreover, we demonstrate the usability and effectiveness of our proposed methodology via elaborating experiences from our industrial practices. Finally, discussions on the application of our methodology are presented.
  • Keywords
    formal verification; logic design; neural nets; ANN; artificial neural networks; coverage model; design bugs prediction; design-under-verification; Complexity theory; Computer bugs; Correlation; Measurement; Predictive models; Training; Training data; Bug Prediction; Complexity Metric; Empirical Study; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763036
  • Filename
    5763036