DocumentCode
3078936
Title
Empirical design bugs prediction for verification
Author
Guo, Qi ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji ; Wu, Yue ; Hu, Weiwu
Author_Institution
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is to expose as many bugs as possible. In this paper, we propose a novel verification methodology that leverages the early bug prediction of a DUV to guide and assess related verification process. To be specific, this methodology utilizes predictive models built upon artificial neural networks (ANNs), which is capable of modeling the relationship between the high-level attributes of a design and its associated bug information. To evaluate the performance of constructed predictive model, we conduct experiments on some open source projects. Moreover, we demonstrate the usability and effectiveness of our proposed methodology via elaborating experiences from our industrial practices. Finally, discussions on the application of our methodology are presented.
Keywords
formal verification; logic design; neural nets; ANN; artificial neural networks; coverage model; design bugs prediction; design-under-verification; Complexity theory; Computer bugs; Correlation; Measurement; Predictive models; Training; Training data; Bug Prediction; Complexity Metric; Empirical Study; Verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763036
Filename
5763036
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