DocumentCode
3082644
Title
Progress on Ion Beam Modulation Technique for Time-Dependent Analytical Instruments
Author
Jingjing, Zhang ; Xiaolin, Qiao
Author_Institution
Inst. of Inf. & Eng., Harbin Inst. of Technol. at Weihai, Weihai, China
fYear
2010
fDate
17-19 Sept. 2010
Firstpage
787
Lastpage
790
Abstract
Both Time-of-flight (TOF) mass spectrometry and ion mobility spectrometry (IMS) are time-dependent analytical instruments which need to quickly and efficiently chop continuous ion beam into small packets for separation based on ion gates device. The effect of ion beam modulation technique can affect to some extent the performance of these instruments, such as resolution or sensitivity. So ion gates are a very important component of these instruments and ion beam modulation methods are key technique of such instruments. This review provides a development of ion beam modulation methods based on ion gates in TOF and IMS and a performance comparison between them.
Keywords
time of flight mass spectrometers; time of flight mass spectroscopy; IMS; TOF mass spectometry; ion beam modulation technique; ion gates; ion mobility spectrometry; time-dependent analytical instruments; time-of-flight mass spectrometry; Instruments; Ion beams; Logic gates; Modulation; Spectroscopy; Transforms; Wire; BNG; IMS; TOFMS; ion beam modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Pervasive Computing Signal Processing and Applications (PCSPA), 2010 First International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4244-8043-2
Electronic_ISBN
978-0-7695-4180-8
Type
conf
DOI
10.1109/PCSPA.2010.196
Filename
5635614
Link To Document