• DocumentCode
    3082644
  • Title

    Progress on Ion Beam Modulation Technique for Time-Dependent Analytical Instruments

  • Author

    Jingjing, Zhang ; Xiaolin, Qiao

  • Author_Institution
    Inst. of Inf. & Eng., Harbin Inst. of Technol. at Weihai, Weihai, China
  • fYear
    2010
  • fDate
    17-19 Sept. 2010
  • Firstpage
    787
  • Lastpage
    790
  • Abstract
    Both Time-of-flight (TOF) mass spectrometry and ion mobility spectrometry (IMS) are time-dependent analytical instruments which need to quickly and efficiently chop continuous ion beam into small packets for separation based on ion gates device. The effect of ion beam modulation technique can affect to some extent the performance of these instruments, such as resolution or sensitivity. So ion gates are a very important component of these instruments and ion beam modulation methods are key technique of such instruments. This review provides a development of ion beam modulation methods based on ion gates in TOF and IMS and a performance comparison between them.
  • Keywords
    time of flight mass spectrometers; time of flight mass spectroscopy; IMS; TOF mass spectometry; ion beam modulation technique; ion gates; ion mobility spectrometry; time-dependent analytical instruments; time-of-flight mass spectrometry; Instruments; Ion beams; Logic gates; Modulation; Spectroscopy; Transforms; Wire; BNG; IMS; TOFMS; ion beam modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pervasive Computing Signal Processing and Applications (PCSPA), 2010 First International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-8043-2
  • Electronic_ISBN
    978-0-7695-4180-8
  • Type

    conf

  • DOI
    10.1109/PCSPA.2010.196
  • Filename
    5635614