• DocumentCode
    3083464
  • Title

    A unified methodology for pre-silicon verification and post-silicon validation

  • Author

    Adir, Allon ; Copty, Shady ; Landa, Shimon ; Nahir, Amir ; Shurek, Gil ; Ziv, Avi ; Meissner, Charles ; Schumann, John

  • Author_Institution
    IBM Res., Haifa, Israel
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The growing importance of post-silicon validation in ensuring functional correctness of high-end designs increases the need for synergy between the pre-silicon verification and post-silicon validation. We propose a unified functional verification methodology for the pre- and post-silicon domains. This methodology is based on a common verification plan and similar languages for test-templates and coverage models. Implementation of the methodology requires a user-directable stimuli generation tool for the post-silicon domain. We analyze the requirements for such a tool and the differences between it and its pre-silicon counterpart. Based on these requirements, we implemented a tool called Threadmill and used it in the verification of the IBM POWER7 processor chip with encouraging results.
  • Keywords
    integrated circuit design; microprocessor chips; monolithic integrated circuits; IBM POWER7 processor chip; high-end designs; postsilicon validation; presilicon verification; threadmill; unified functional verification methodology; user-directable stimuli generation tool; Acceleration; Computer bugs; Generators; Instruction sets; Load modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763252
  • Filename
    5763252