• DocumentCode
    3083870
  • Title

    Indoor and outdoor evaluation of missile prototype scattering diagrams

  • Author

    Miacci, Marcelo Alexandre Souza ; Martin, Inácio Malmonge ; Rezende, Mirabel Cerqueira

  • Author_Institution
    Sao Jose dos Campos
  • fYear
    2005
  • fDate
    25-25 July 2005
  • Firstpage
    566
  • Lastpage
    569
  • Abstract
    Radar cross section (RCS) measurements allow the equivalent area of a target when illuminated by radar to be determined. In other words, the RCS is the ratio between the energy of an electromagnetic wave emitted by radar that impinges on a target and the energy scattered by it. The scattering measurements can be performed monostatically, whereby the electromagnetic waves reflected by the target are measured in the same direction as the emitting source (radar), or by the bistatic method, when the reflected waves are captured in other directions. This article discusses the preliminary work currently being developed at AMR/IAE/CTA, involving the characterization of RAM (radar absorbing materials) applied on a target with complex geometry. In this particular study a missile prototype was used. The methodologies employed here are based on a closed-field (indoor) RCS range, using an anechoic chamber, and an open-field (outdoor) RCS range, both in the X-band frequency range
  • Keywords
    anechoic chambers (electromagnetic); electromagnetic wave absorption; electromagnetic wave reflection; electromagnetic wave scattering; microwave materials; missiles; radar cross-sections; X-band frequency range; anechoic chamber; bistatic method; complex geometry; electromagnetic wave emission; missile prototype scattering diagrams; radar absorbing materials; radar cross section; scattering measurements; Area measurement; Electromagnetic measurements; Electromagnetic scattering; Geometry; Missiles; Performance evaluation; Prototypes; Radar cross section; Radar measurements; Radar scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
  • Conference_Location
    Brasilia
  • Print_ISBN
    0-7803-9341-4
  • Type

    conf

  • DOI
    10.1109/IMOC.2005.1580126
  • Filename
    1580126