DocumentCode
3086235
Title
Micromachined high aspect ratio coplanar waveguide with high impedance and low loss on low resistivity silicon
Author
Todd, Shane T. ; Bowers, John E. ; MacDonald, Noel C.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
fYear
2010
fDate
23-28 May 2010
Firstpage
876
Lastpage
879
Abstract
A micromachining process has been developed to create high impedance and low loss high aspect ratio coplanar waveguide (HARC) on low resistivity silicon. The process uses silicon DRIE to create an array of tall mesas that are spaced with a precise pitch. The silicon mesa array is then merged into a single solid SiO2 mesa using thermal oxidation. The solid SiO2 mesa creates a wide dielectric for use in high impedance HARC. The complete fabrication process includes DRIE, thermal oxidation, electroplating, planarization, and substrate removal to create HARC on low resistivity silicon with a planar surface. A high impedance HARC has been fabricated on silicon using this method. Measurements show that silicon substrate removal increases the line impedance from 20 Ω to 57 Ω, reduces effective dielectric constant from 6 to 2, and reduces attenuation constant from 33 dB/cm to 4 dB/cm @ 30 GHz. Measurements are compared to an analytical model derived for HARC.
Keywords
CMOS integrated circuits; MMIC; coplanar waveguides; micromachining; silicon compounds; MMIC; RF CMOS; SiO2; effective dielectric constant; frequency 30 GHz; high impedance HARC; low loss high aspect ratio coplanar waveguide; low resistivity silicon; micromachined high aspect ratio coplanar waveguide; monolithic microwave integrated circuits; planar surface; resistance 20 ohm to 57 ohm; single solid mesa; thermal oxidation; Conductivity; Coplanar waveguides; Dielectric measurements; Dielectric substrates; Fabrication; Micromachining; Oxidation; Silicon; Solids; Surface impedance; MEMS; RF CMOS; coplanar waveguides; high aspect ratio; micromachining; transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5514783
Filename
5514783
Link To Document