• DocumentCode
    3086235
  • Title

    Micromachined high aspect ratio coplanar waveguide with high impedance and low loss on low resistivity silicon

  • Author

    Todd, Shane T. ; Bowers, John E. ; MacDonald, Noel C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    876
  • Lastpage
    879
  • Abstract
    A micromachining process has been developed to create high impedance and low loss high aspect ratio coplanar waveguide (HARC) on low resistivity silicon. The process uses silicon DRIE to create an array of tall mesas that are spaced with a precise pitch. The silicon mesa array is then merged into a single solid SiO2 mesa using thermal oxidation. The solid SiO2 mesa creates a wide dielectric for use in high impedance HARC. The complete fabrication process includes DRIE, thermal oxidation, electroplating, planarization, and substrate removal to create HARC on low resistivity silicon with a planar surface. A high impedance HARC has been fabricated on silicon using this method. Measurements show that silicon substrate removal increases the line impedance from 20 Ω to 57 Ω, reduces effective dielectric constant from 6 to 2, and reduces attenuation constant from 33 dB/cm to 4 dB/cm @ 30 GHz. Measurements are compared to an analytical model derived for HARC.
  • Keywords
    CMOS integrated circuits; MMIC; coplanar waveguides; micromachining; silicon compounds; MMIC; RF CMOS; SiO2; effective dielectric constant; frequency 30 GHz; high impedance HARC; low loss high aspect ratio coplanar waveguide; low resistivity silicon; micromachined high aspect ratio coplanar waveguide; monolithic microwave integrated circuits; planar surface; resistance 20 ohm to 57 ohm; single solid mesa; thermal oxidation; Conductivity; Coplanar waveguides; Dielectric measurements; Dielectric substrates; Fabrication; Micromachining; Oxidation; Silicon; Solids; Surface impedance; MEMS; RF CMOS; coplanar waveguides; high aspect ratio; micromachining; transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5514783
  • Filename
    5514783