• DocumentCode
    3086261
  • Title

    Modeling and analysis of surface wave EMAT and its acoustic field

  • Author

    Zhichao, Li ; Kang Lei ; Shujuan, Wang ; Guofu, Zhai

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    89
  • Lastpage
    93
  • Abstract
    Surface wave is widely used to detect and locate the surface and sub-surface defects. A model has been developed for the calculation of surface wave generated by an electromagnetic acoustic transducer (EMAT) operating on the Lorentz principle by finite element method. We establish the displacement model of surface wave based on acoustic theory in elastic solids. The surface wave is measured by a Michelson laser interferometer, and good agreement is observed between the calculated and measured results, verifying the validity of the finite element model. It is concluded that Lorentz force contains two components which are excited by static and dynamic magnetic field respectively. And Lorentz force due to static magnetic field plays a dominate role in generating surface wave when the excitation current is lower than 793.9 A, while that due to dynamic one is dominate when the current exceeds 793.9 A.
  • Keywords
    Michelson interferometers; acoustic transducers; acoustic waves; finite element analysis; Lorentz force; Lorentz principle; Michelson laser interferometer; acoustic theory; displacement model; elastic solids; electromagnetic acoustic transducer; excitation current; finite element method; static magnetic field; surface wave; Acoustic measurements; Acoustic signal detection; Acoustic transducers; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic scattering; Finite element methods; Lorentz covariance; Magnetic field measurement; Surface acoustic waves; EMAT; finite element method; laser interferometer; surface wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5514784
  • Filename
    5514784