• DocumentCode
    3088052
  • Title

    Efficient concurrent simulation of large networks using various fault models

  • Author

    Weststrate, Evan ; Panetta, Karen

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    51
  • Lastpage
    55
  • Abstract
    An improved fault simulation environment is described, and details of its faulting capability are presented and tested. The versatility of our fault simulator in handling different fault models by adding new activity functions to our modeling structure such as n-terminal bridge faults is shown. We use our TUFTsim simulator, which is based on concurrent simulation algorithms to efficiently fault-simulate large networks, and the multiple list traversal mechanism handles the propagation of concurrent elements through the topology. Results on some of the ITC ´99 benchmarks are shown based on the stuck-at and logical bridge fault models. The use of the bridge fault in combination with the stuck-at model does not depreciate the simulation efficiency
  • Keywords
    circuit simulation; fault simulation; logic testing; parallel algorithms; ITC ´99 benchmarks; TUFTsim simulator; activity functions; concurrent simulation algorithms; fault models; fault simulation; large networks; logical bridge faults; multiple list traversal mechanism; stuck-at faults; Bridge circuits; Circuit faults; Circuit simulation; Complexity theory; Computational modeling; Computer simulation; Data structures; Educational institutions; Network topology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Symposium, 2001. Proceedings. 34th Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    1080-241X
  • Print_ISBN
    0-7695-1092-2
  • Type

    conf

  • DOI
    10.1109/SIMSYM.2001.922114
  • Filename
    922114