Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images

Author

Malik, Aamir Saeed ; Choi, Tae-Sun

Author_Institution

Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia

Volume

2

fYear

2009

fDate

28-30 Dec. 2009

Firstpage

529

Lastpage

532

Abstract

Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, shape from focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.

Keywords

focusing; image texture; lighting; object recognition; reflectivity; depth estimation; focus measures; microscopic images; microscopic objects; passive 3D shape recovery methods; shape from focus; source illumination; texture reflectance effect analysis; Electric variables measurement; Focusing; Image analysis; Image texture analysis; Lenses; Lighting; Microscopy; Reflectivity; Shape measurement; Testing; Depth map estimation; Focus measure; Microscopic images; Shape from focus;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer and Electrical Engineering, 2009. ICCEE '09. Second International Conference on

Conference_Location

Dubai

Print_ISBN

978-1-4244-5365-8

Electronic_ISBN

978-0-7695-3925-6

Type

conf

DOI

10.1109/ICCEE.2009.148

Filename

5380228