• DocumentCode
    309182
  • Title

    The effect of substrate materials on the thermo-mechanical behavior of multilayered structures

  • Author

    Dunne, Rajiv C. ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1997
  • fDate
    9-12 Mar 1997
  • Firstpage
    134
  • Lastpage
    138
  • Abstract
    At the Packaging Research Center, research on a new MCM DL technology called “SLIM (Single Level Integrated Module)” is currently being pursued This consists of a multilayered substrate, which includes passive layers such as capacitor, inductor and resistor layers, in addition to the power, X-Y signal and ground layers. The present study focuses on predicting the substrate warpage and interfacial stress-strain distribution of this complex multilayered structure under uniform thermal loading. The effect of some key parameters such as base layer thickness, base layer material, interlayer dielectric material, and thermal load has been studied on an idealized model to understand the thermo-mechanical response of the substrate. Preliminary design/material recommendations are suggested for enhanced thermo-mechanical integrity of the integrated substrate
  • Keywords
    ceramics; dielectric thin films; elastic moduli; finite element analysis; interface phenomena; laminates; multichip modules; plastic packaging; polymer films; stress-strain relations; substrates; thermal expansion; MCM DL technology; SLIM; X-Y signal layers; base layer material; base layer thickness; ceramic; enhanced thermo-mechanical integrity; epoxy-glass laminate; ground layers; idealized model; interfacial stress-strain distribution; interlayer dielectric material; multilayered structures; passive layers; polymer materials; power layers; single level integrated module; substrate materials effect; substrate warpage; thermo-mechanical behavior; uniform thermal loading; Dielectric substrates; Electronic packaging thermal management; Electronics packaging; Mechanical engineering; Shearing; Thermal expansion; Thermal loading; Thermal stresses; Thermomechanical processes; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials. Proceedings., 3rd International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-7803-3818-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.1997.581277
  • Filename
    581277