• DocumentCode
    3093971
  • Title

    A novel ACO-based pattern generation for peak power estimation in VLSI circuits

  • Author

    Liu, Yi-Ling ; Wang, Chun-Yao ; Chen, Yung-Chih ; Chang, Ya-Hsin

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    317
  • Lastpage
    323
  • Abstract
    Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue of this task is which pattern pair would cause this peak power value. An exhaustive search from all possible combinations is time-consuming and impractical for VLSI circuits with hundreds of inputs. In this paper, a new pattern generation approach with Ant Colony Optimization, which imitates the behavior of ants looking for foods, is proposed for peak power estimation. The approach returns patterns which are highly suspicious to consuming the peak power. The gate delay issue is considered in this work. Furthermore, the valid state issue in sequential circuits is considered as well. Since the real delay value is technology-dependent, these generated patterns of our approach and other approaches are then applied into a commercial power calculation tool, PrimePower, to demonstrate the effectiveness of the approach under the TSMC 0.18 mum and TSMC 0.13 mum library. The experimental results show that an average of 76% tighter lower bound for the ISCAS´85 combinational benchmarks and 52% for the ISCAS´89 sequential circuits are obtained as compared to random patterns under the TSMC 0.18 mum library. For TSMC 0.13 mum library, our patterns obtain 90% and 56% improvements over the random patterns for ISCAS´85 and ISCAS´89, respectively. As compared with the previous work, our results are also competitive.
  • Keywords
    CMOS logic circuits; VLSI; optimisation; power consumption; sequential circuits; VLSI circuits; ant colony optimization; gate delay issue; maximal power consumption estimation; pattern generation; peak power estimation; sequential circuits; Circuit testing; Delay; Energy consumption; Hazards; Libraries; Microwave integrated circuits; Power dissipation; Power generation; Sequential circuits; Very large scale integration; Ant Colony Optimization (ACO); peak power estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810314
  • Filename
    4810314