DocumentCode
3093971
Title
A novel ACO-based pattern generation for peak power estimation in VLSI circuits
Author
Liu, Yi-Ling ; Wang, Chun-Yao ; Chen, Yung-Chih ; Chang, Ya-Hsin
Author_Institution
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
fYear
2009
fDate
16-18 March 2009
Firstpage
317
Lastpage
323
Abstract
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue of this task is which pattern pair would cause this peak power value. An exhaustive search from all possible combinations is time-consuming and impractical for VLSI circuits with hundreds of inputs. In this paper, a new pattern generation approach with Ant Colony Optimization, which imitates the behavior of ants looking for foods, is proposed for peak power estimation. The approach returns patterns which are highly suspicious to consuming the peak power. The gate delay issue is considered in this work. Furthermore, the valid state issue in sequential circuits is considered as well. Since the real delay value is technology-dependent, these generated patterns of our approach and other approaches are then applied into a commercial power calculation tool, PrimePower, to demonstrate the effectiveness of the approach under the TSMC 0.18 mum and TSMC 0.13 mum library. The experimental results show that an average of 76% tighter lower bound for the ISCAS´85 combinational benchmarks and 52% for the ISCAS´89 sequential circuits are obtained as compared to random patterns under the TSMC 0.18 mum library. For TSMC 0.13 mum library, our patterns obtain 90% and 56% improvements over the random patterns for ISCAS´85 and ISCAS´89, respectively. As compared with the previous work, our results are also competitive.
Keywords
CMOS logic circuits; VLSI; optimisation; power consumption; sequential circuits; VLSI circuits; ant colony optimization; gate delay issue; maximal power consumption estimation; pattern generation; peak power estimation; sequential circuits; Circuit testing; Delay; Energy consumption; Hazards; Libraries; Microwave integrated circuits; Power dissipation; Power generation; Sequential circuits; Very large scale integration; Ant Colony Optimization (ACO); peak power estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2952-3
Electronic_ISBN
978-1-4244-2953-0
Type
conf
DOI
10.1109/ISQED.2009.4810314
Filename
4810314
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