DocumentCode
3094714
Title
Third-order effects in SAW and BAW device modeling
Author
Baghai-Wadji, A.R.
Author_Institution
Lab. of Mater. Phys., Helsinki Univ. of Technol., Espoo, Finland
Volume
1
fYear
2000
fDate
36800
Firstpage
143
Abstract
In previous works we have demonstrated the feasibility of the fast-BEM to tackle the 2D mass-loading effect. This paper is devoted to the modeling of three third-order effects in SAW and BAW devices by enhancing fast-BEM´s computational performance even further. (1) Electric charges residing on an electrode´s boundary surface outside the substrate: a model is presented for the analysis of the mass-loading effect, which accounts for the induced electric charges on an electrode´s entire boundary surface. (2) Electric charges in motion: a method has been outlined which accounts for the vibration of the electric charges on an electrode´s boundary surface. (3) 3D effects: the above-mentioned 2D models assume infinitely long electrodes. Our final model removes this restriction. We discuss the associated Green´s functions, their regularization, and the calculation of the associated higher moments for the 3D mass-loading analysis. Here also we account for the motion of the electric charges which are confined to an electrode´s boundary surface, and which follow electrode´s vibrations
Keywords
Green´s function methods; boundary-elements methods; bulk acoustic wave devices; electric charge; electrodes; modelling; surface acoustic wave devices; vibrations; 2D models; 3D effects; 3D mass-loading analysis; BAW device modeling; Green functions; Maxwell stress tensor; SAW device modeling; electric charge motion; electric charge vibration; electric charges; electric field approximation; electrode boundary surface; mass-loading effect; third-order effects; Acoustic devices; Bulk acoustic wave devices; Electrodes; Frequency; Industrial electronics; Laboratories; Materials science and technology; Motion analysis; Physics; Surface acoustic waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2000 IEEE
Conference_Location
San Juan
ISSN
1051-0117
Print_ISBN
0-7803-6365-5
Type
conf
DOI
10.1109/ULTSYM.2000.922527
Filename
922527
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