• DocumentCode
    309671
  • Title

    Performance comparison of time-frequency distributions for ultrasonic nondestructive testing

  • Author

    Malik, M.A. ; Saniie, J.

  • Author_Institution
    EET Dept., DeVry Inst. of Technol., Chicago, IL, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    3-6 Nov 1996
  • Firstpage
    701
  • Abstract
    In the nondestructive testing of materials ultrasonic backscattered echoes often exhibit critical time and frequency information. The time-frequency (t-f) analysis of ultrasonic signals instantaneously reveals the frequency and time of arrival of target echoes which help to characterize the target. But varying results are obtained by applying different t-f algorithms to ultrasonic signals. Performance evaluation of t-f algorithms for ultrasonic testing is useful for the choice of an algorithm. In this paper we present a performance comparison of t-f algorithms for ultrasonic applications. In particular, we compare the t-f algorithms based on the detection of the time of arrival and frequency of target echoes, estimation of instantaneous frequency of multiple target echoes, and cross-terms attenuation and concentration. These characteristics are studied by applying Wigner-Ville distribution (WVD), exponential distribution (ED), Gabor transform (GT), and wavelet transform (WT) to simulated and experimental ultrasonic data
  • Keywords
    Wigner distribution; acoustic signal processing; echo; exponential distribution; time-frequency analysis; ultrasonic materials testing; wavelet transforms; Gabor transform; Wigner-Ville distribution; algorithm; backscattered echo; exponential distribution; time-frequency distribution; ultrasonic nondestructive testing; wavelet transform; Attenuation; Exponential distribution; Frequency estimation; Kernel; Nondestructive testing; Performance analysis; Signal analysis; Signal generators; Time frequency analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-3615-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1996.584071
  • Filename
    584071