• DocumentCode
    3098130
  • Title

    A Facial-Skin Condition Classification System in Wavelet Domain

  • Author

    Lee, Jiann-Der ; Chen, Yu-Chi ; Liu, Li-Chang ; Huang, Chung-Hsien

  • Author_Institution
    Chang Gung Univ., Tao-Yuan
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    2419
  • Lastpage
    2422
  • Abstract
    This paper describes a facial-skin condition evaluation system based on cosmetician´s suggestions to let the users realize their facial-skin conditions. Two kinds of features are extracted from the captured skin image. Four parameters of sub-band information of the gray part of a color skin image in wavelet domain are used as the first kind of features. The contrast, inverse difference moment, deviation information in the gray-value histogram, and the entropy of the co-occurrence matrix information are calculated as the second kind of features. The fuzzy rule extraction on the first-kind features is sued to distinguish the oily skin group from the others. The fuzzy c-means process with the second-kind features is used to classify the neutral skin and the dry skin. In the experiments, the classified results are compared with the cosmeticians´ results, and the correct rates are 100% for the first test group of 30 test images and 92.8% for the second test group of 14 images.
  • Keywords
    feature extraction; fuzzy set theory; image classification; image colour analysis; matrix algebra; skin; wavelet transforms; co-occurrence matrix information; color skin image; dry skin; facial-skin condition classification system; facial-skin condition evaluation system; feature extraction; fuzzy c-means process; fuzzy rule extraction; gray-value histogram; inverse difference moment; neutral skin; sub-band information; wavelet domain; Data mining; Embedded system; Entropy; Feature extraction; Filters; Histograms; Lubricating oils; Skin; Testing; Wavelet domain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
  • Conference_Location
    Taipei
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0783-4
  • Type

    conf

  • DOI
    10.1109/IECON.2007.4460152
  • Filename
    4460152