DocumentCode
3098492
Title
Progress in nonpolar and semipolar GaN materials and devices
Author
Speck, James S.
Author_Institution
Mater. Dept., Univ. of California, Santa Barbara, CA, USA
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
1
Lastpage
1
Abstract
Devices grown on c-plane GaN suffer from large internal electric fields due to discontinuities in spontaneous and piezoelectric polarization effects which cause charge separation between holes and electrons in quantum wells and limits the radiative recombination efficiency. Nonpolar GaN devices, such as in the m-plane (1100), are free from polarization related electric fields since the polar c-axis is parallel to any heterointerfaces. Semipolar GaN-based devices have reduced electric fields and in some cases, such as (1122), show a high propensity for Indium update for InGaN quantum wells.
Keywords
III-V semiconductors; gallium compounds; indium compounds; quantum well devices; semiconductor quantum wells; wide band gap semiconductors; InGaN; c-plane gallium nitride; charge separation; electric fields; heterointerfaces; indium gallium nitride quantum wells; nonpolar gallium nitride materials; piezoelectric polarization effect; radiative recombination efficiency; semipolar gallium nitride devices; Educational institutions; Electric fields; Gallium nitride; Light emitting diodes; Performance evaluation; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4577-1755-0
Type
conf
DOI
10.1109/ISDRS.2011.6135199
Filename
6135199
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