• DocumentCode
    3099108
  • Title

    A fatigue theory for solders

  • Author

    Wen, Shengmin ; Keer, Leon M.

  • Author_Institution
    Dept. of Civil Eng., Northwestern Univ., Evanston, IL, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    120
  • Lastpage
    127
  • Abstract
    A fatigue theory with its definition of fatigue failure criterion based on physical damage mechanisms is presented for solders. The theory applies Mura´s micromechanical fatigue model to each individual grain of the solder structure, where grain´s crystallographic orientation is taken into account. A solder structure is defined as fatigued when the ratio of its failed grains reaches a critical percolation threshold, since at this point the failed grains may form a large cluster. Experimental data for 96.5Pb-3.5Sn solder showed good agreement with prediction by the theory and its failure criterion. The theory is anisotropic, and thus there is no size limitation to its application, making it applicable to anisotropic small-scale (micron scale or smaller) solder joints
  • Keywords
    assembling; circuit reliability; crystal microstructure; crystal orientation; failure analysis; fatigue; percolation; soldering; Mura micromechanical fatigue model; Pb-Sn solder data; PbSn; anisotropic small-scale solder joints; anisotropic theory; critical percolation threshold; crystallographic orientation; failed grain cluster formation; failed grain ratio; failure criterion; fatigue failure criterion; fatigue theory; fatigued solder structure; physical damage mechanisms; solder grain structure; solders; Anisotropic magnetoresistance; Capacitive sensors; Civil engineering; Fatigue; Micromechanical devices; Optical microscopy; Scanning electron microscopy; Soldering; Surface cracks; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6587-9
  • Type

    conf

  • DOI
    10.1109/RELPHY.2001.922891
  • Filename
    922891