• DocumentCode
    3101439
  • Title

    Permission to reprint or copy

  • fYear
    2009
  • fDate
    15-19 March 2009
  • Abstract
    Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of U.S. copyright law for private use of patrons those articles in this volume that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923 U.S.A. For other copying, reprint, or republication permission, write to IEEE Copyrights Manager, IEEE Service Center, 445 Hoes Lane, PO Box 1331, Piscataway, NJ 08866-1331 U.S.A. All rights reserved. Copyright (c)2009 by the Institute of Electrical and Electronics Engineers, Inc.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-3664-4
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2009.4810726
  • Filename
    4810726