• DocumentCode
    3101555
  • Title

    A SIFT Method Application for a Six DOF Manipulator Grasping an Object against Complicated Environment

  • Author

    Hung, Shih Che ; Li, Ming Fung

  • Author_Institution
    Micro Star Int. CO. LTD., Taipei
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    465
  • Lastpage
    470
  • Abstract
    This paper presents an image process based results for controlling a manipulator grasping an object against complicated background environment. Some problems caused by environment which exist including 1) orientation and distance measurement inaccuracy - 2) image distortion from lens - 3) grasp point estimation and force-closure judgment - 4) pose control of manipulator - 5) complex background and light reflection. The work begins from perception of environment and objects by image system. The specified objects searching based on SIFT approach keeps working with the pan-tilt vision till finding out those targets. The information at least provided by SIFTreg contains 1) recognition confidence (%) - 2) centred location (X, Y) of an object in image frame and estimated distance in absolute frame (D) and 3) matched index (user defined text) for an object. By these data, the manipulator controller can align the gripper frame to the object as close as possible and execute grasp mission. Both searching and tracking for specific objects in these configurations are proven powerful.
  • Keywords
    grippers; manipulators; object recognition; robot vision; complicated environment object grasping; force-closure judgment; grasp point estimation; image distortion; image frame; image process; manipulator grasping; manipulator pose control; object centred location; recognition confidence; six DOF manipulator; CMOS image sensors; Distance measurement; Feedback; Force control; Grasping; Grippers; Infrared sensors; Manipulators; Sensor systems; Servosystems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
  • Conference_Location
    Taipei
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0783-4
  • Type

    conf

  • DOI
    10.1109/IECON.2007.4460347
  • Filename
    4460347