DocumentCode
3102439
Title
Interaction between TIM1 and TIM2 for mechanical robustness of integrated heat spreader
Author
Kearney, Andrew ; Li, Li ; Sanford, Sean
Author_Institution
Cisco Syst., Inc., San Jose, CA
fYear
2009
fDate
15-19 March 2009
Firstpage
293
Lastpage
298
Abstract
Integrated Heat Spreader (IHS) lids are increasingly being used in flip-chip package technology to enhance power and thermal capabilities. Adequate adhesion of the thermal interface material (TIM) and lid sealant materials are required to not only provide a continuous thermal interface, but also to permit manufacturability. This paper outlines criteria to aid in the material selection process for the first level TIM (TIM1) and the lid sealant to improve its mechanical reliability. It also highlights the importance of understanding the mechanical interaction between the TIM1 and TIM2 layers. A fracture mechanics-based approach is used to provide guidelines for the mechanical properties of the TIM1 and lid sealant material relative to the TIM2. From this modeling, guidelines for lid adhesion strength are defined for a range of package dimensions.
Keywords
adhesion; flip-chip devices; heat sinks; integrated circuit packaging; integrated circuit reliability; sealing materials; thermal management (packaging); flip-chip package technology; integrated heat spreader lids; lid adhesion strength; lid sealant materials; mechanical reliability; thermal interface material; Adhesives; Conducting materials; Guidelines; Heat sinks; Heat transfer; Mechanical factors; Packaging; Robustness; Sealing materials; Thermal force; Heat spreader; adhesion; sealant; thermal interface material;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4244-3664-4
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2009.4810778
Filename
4810778
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