• DocumentCode
    3104559
  • Title

    High-sensitivity Single-Photon Emission Computed Tomography (SPECT): Safer, faster, and more accurate SPECT

  • Author

    Subbarao, Murali

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Stony Brook Univ., Stony Brook, NY, USA
  • fYear
    2011
  • fDate
    2-3 Nov. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A method and apparatus are described for high-sensitivity Single-Photon Emission Computed Tomography (SPECT). The apparatus includes a two-dimensional (2D) gamma detector array that, unlike a conventional SPECT machine, moves to different positions in a three-dimensional (3D) volume space near an emission source and records a data vector g which is a measure of gamma emission field. In particular, the 3D volume space in which emission data g is measured extends substantially along a radial direction r pointing away from the emission source, and unlike a conventional SPECT machine, each photon detector element in the 2D gamma detector array is provided with a very large collimator aperture. Data g is related to the 3D spatial density distribution f of the emission source, noise vector n, and a system matrix H of the SPECT apparatus through the linear system of equations g = Hf+n. This equation is solved for f by a method that reduces the effect of noise.
  • Keywords
    gamma-ray detection; noise; single photon emission computed tomography; 3D spatial density distribution; SPECT; conventional SPECT machine; data vector g; emission source; high-sensitivity single-photon emission computed tomography; noise vector; photon detector element; system matrix H; three-dimensional volume space; two-dimensional gamma detector array; Apertures; Art; Collimators; Image reconstruction; Single photon emission computed tomography; Three dimensional displays; Positron Emission Tomography (PET); Single-Photon Emission Computed Tomography (SPECT); computed tomography; medical imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies for a Smarter World (CEWIT), 2011 8th International Conference & Expo on
  • Conference_Location
    New York, NY
  • Print_ISBN
    978-1-4577-1592-1
  • Electronic_ISBN
    978-1-4577-1590-7
  • Type

    conf

  • DOI
    10.1109/CEWIT.2011.6135884
  • Filename
    6135884