DocumentCode
3105165
Title
2004 ROCS Workshop Proceedings [Reliability of Compound Semiconductors] (IEEE Cat. No. 04TH8787)
fYear
2004
fDate
24-24 Oct. 2004
Abstract
Presents the table of contents of the proceedings.
Keywords
III-V semiconductors; capacitors; field effect transistors; gallium arsenide; heterojunction bipolar transistors; high electron mobility transistors; p-i-n diodes; semiconductor device reliability; thermal resistance; GaAs; HBT reliability; HFET; PIN switches; capacitors; device thermal resistance; pHEMT; two-terminal devices; Capacitors; FETs; Gallium compounds; Heterojunction bipolar transistors; MODFETs; Semiconductor device reliability; Thermoresistivity; p-i-n diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2004.[Reliability of Compound Semiconductors]
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7908-0105-1
Type
conf
DOI
10.1109/ROCS.2004.184333
Filename
1424924
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