DocumentCode
3106301
Title
Diagnosis of tunneling opens
Author
Li, James C M ; McCluskey, E.J.
Author_Institution
Center for Reliable Comput., Stanford Univ., CA, USA
fYear
2001
fDate
2001
Firstpage
22
Lastpage
27
Abstract
This paper resolves two issues regarding diagnosis of tunneling opens: efficient screening and accurate localization. In the first part, a test pattern selection and sorting algorithm is presented. It is shown that the presented algorithm saves IDDQ(t) test time without impacting on its effectiveness. The second part of this paper presents a locating algorithm which combines both VLV and IDDQ(t) test results. This technique is shown to be able to accurately locate the tunneling opens with higher resolution than commercial single stuck-at fault diagnosis tool
Keywords
automatic testing; failure analysis; integrated circuit testing; integrated circuit yield; production testing; localization; locating algorithm; screening; sorting algorithm; test pattern selection; tunneling opens; Automatic test pattern generation; Circuit faults; Circuit testing; Cyclic redundancy check; Fault diagnosis; Semiconductor device measurement; Sorting; Test pattern generators; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923413
Filename
923413
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