• DocumentCode
    3108947
  • Title

    A test facility for PCSS triggered pulsed power switches

  • Author

    Swalby, M.E. ; Glover, S.F. ; Zutavern, F.J. ; Reed, K.W. ; Cich, M.J. ; Mar, A. ; Saiz, T.A. ; Horry, M.L. ; White, F.E.

  • Author_Institution
    Sandia National Laboratories, Albuquerque, NM 87185 USA
  • Volume
    1
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    101
  • Lastpage
    105
  • Abstract
    The cost and complexity of pulsed power systems continue to increase as researchers strive for more precise control and flexibility. Systems with large numbers of switches or large numbers of switch trigger times result in the need for more cost effective high performance triggering systems. This need can be addressed by photoconductive semiconductor switches (PCSS) that have demonstrated sub-nanosecond jitter with up to 300kV switches. Previous work has motivated continued research into the trigger system parameters that allow for reliable cost effective operation.
  • Keywords
    Circuit testing; Costs; Diode lasers; Optical arrays; Particle beam optics; Pulse power systems; Semiconductor laser arrays; Switches; Test facilities; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4651799
  • Filename
    4651799