DocumentCode
3108947
Title
A test facility for PCSS triggered pulsed power switches
Author
Swalby, M.E. ; Glover, S.F. ; Zutavern, F.J. ; Reed, K.W. ; Cich, M.J. ; Mar, A. ; Saiz, T.A. ; Horry, M.L. ; White, F.E.
Author_Institution
Sandia National Laboratories, Albuquerque, NM 87185 USA
Volume
1
fYear
2007
fDate
17-22 June 2007
Firstpage
101
Lastpage
105
Abstract
The cost and complexity of pulsed power systems continue to increase as researchers strive for more precise control and flexibility. Systems with large numbers of switches or large numbers of switch trigger times result in the need for more cost effective high performance triggering systems. This need can be addressed by photoconductive semiconductor switches (PCSS) that have demonstrated sub-nanosecond jitter with up to 300kV switches. Previous work has motivated continued research into the trigger system parameters that allow for reliable cost effective operation.
Keywords
Circuit testing; Costs; Diode lasers; Optical arrays; Particle beam optics; Pulse power systems; Semiconductor laser arrays; Switches; Test facilities; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2007 16th IEEE International
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0913-6
Electronic_ISBN
978-1-4244-0914-3
Type
conf
DOI
10.1109/PPPS.2007.4651799
Filename
4651799
Link To Document