DocumentCode
3110429
Title
A Robust Tool for Newborn Infant Cry Analysis
Author
Manfredi, Claudia ; Tocchioni, Valentina ; Bocchi, Leonardo
Author_Institution
Dept. of Electron. & Telecommun., Univ. degli Studi di Firenze
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
509
Lastpage
512
Abstract
In this paper, a new robust adaptive tool for new born infant cry analysis is proposed, characterised by high tracking capability, well suited for the signals under study. It performs F noise and resonance frequencies tracking, on signal frames of varying length (even few ms), adaptively tailored to varying signal characteristics. Moreover, voiced/unvoiced separation is implemented, allowing disregarding unvoiced parts of the signal where misleading results could be obtained. Plots of F and its harmonics, noise tracking, spectrogram with resonance frequencies superimposed, are presented in a coloured-scale. Some added statistics allow further understanding and comparison of results. The new software tool is completely automatic, working with any sampling frequency and F and also with strongly corrupted signals, and does not need any manual setting of whatever option to be made by the user, thus being easily usable also by non-experts. Some examples are reported, concerning both healthy and pathological new-born infant cries
Keywords
bioacoustics; medical signal processing; obstetrics; signal sampling; spectral analysis; statistical analysis; F noise; healthy new-born infant cries; newborn infant cry analysis; noise tracking; pathological new-born infant cries; resonance frequencies tracking; robust adaptive tool; sampling frequency; signal characteristics; spectral analysis; spectrogram; statistics; voiced-unvoiced separation; Colored noise; Noise robustness; Pediatrics; Resonance; Resonant frequency; Sampling methods; Signal analysis; Software tools; Spectrogram; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259802
Filename
4461798
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