DocumentCode
3111789
Title
Numerical study of reflection and transmission coefficients for different inhomogeneous walls
Author
Stratis, G. ; Demetriou, D.
Author_Institution
NetPlan RF Planning Tool, Motorola Inc., Arlington Heights, IL, USA
Volume
1
fYear
1999
fDate
11-16 July 1999
Firstpage
590
Abstract
Analytical expressions such as Fresnel reflection and transmission coefficients have been extensively used in most of the ray tracing simulation tools for the last few years. Although these tools predict the field accurately for simple homogeneous wall structures, it is difficult if not impossible, to extend such an analysis to find reflection and transmission coefficients for walls composed of dielectric and imperfectly conducting materials. In the past we demonstrated the successful application of the finite difference time domain (FDTD) method to numerically obtain reflection and transmission coefficients for pure homogeneous layered walls. We also compared measurements with the FDTD method for a certain type of inhomogeneous wall with satisfactory results. In this paper we further extend the FDTD approach to analyze the transmitted and reflected fields from 2-D inhomogeneous walls which represent practical wall structures, in order to identify the importance of the various parameters such as thickness, permittivity, and presence or absence of metallic rebars.
Keywords
conducting materials; dielectric materials; electromagnetic fields; electromagnetic wave reflection; electromagnetic wave transmission; finite difference time-domain analysis; inhomogeneous media; permittivity; ray tracing; 2D inhomogeneous walls; FDTD method; Fresnel reflection coefficient; Fresnel transmission coefficient; analytical expressions; dielectric materials; finite difference time domain; homogeneous layered walls; imperfectly conducting materials; metallic rebars; numerical study; permittivity; ray tracing simulation tools; reflected fields; thickness; transmitted fields; Analytical models; Databases; Dielectrics; Finite difference methods; Frequency; Fresnel reflection; Glass; Permittivity; Polarization; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-5639-x
Type
conf
DOI
10.1109/APS.1999.789208
Filename
789208
Link To Document