DocumentCode
3111907
Title
A Case Study in Scheduling Reentrant Manufacturing Lines: Optimal and Simulation-Based Approaches
Author
Ramírez-Hernández, José A. ; Fernandez, Emmanuel
Author_Institution
Department of Electrical & Computer Engineering & Computer Science, University of Cincinnati, OH 45221, USA. Email: ramirejs@ececs.uc.edu.
fYear
2005
fDate
12-15 Dec. 2005
Firstpage
2158
Lastpage
2163
Abstract
This paper presents initial results of a research study in the optimal scheduling (i.e., job sequencing) in Reentrant Manufacturing Lines (RML), motivated by applications in semiconductor manufacturing. In particular, a simple benchmark RML is utilized, and the optimal scheduling policy is analyzed for an infinite horizon discounted cost problem formulation. The optimality equation and condition are derived, and optimal policy results are obtained for general non-negative one-stage cost functions (in the buffer size). Computational experiments are also performed using the Modified Policy Iteration algorithm. Preliminary experiments on the application of a Neuro-Dynamic Programming (NDP) method (i.e., Q-learning) to approximate the optimal scheduling policy are then presented, when linear and quadratic one-stage cost functions are considered. These experiments show that the Q-learning algorithm gradually approximates the optimal policy as the number of iterations increases and longer simulation lengths are utilized. However, the computational load required by the algorithm increases exponentially with the number of states. Results from this study represent an initial and exploratory research in the application of NDP methods to large-scale RML systems. More extensive research in both exact optimal results and efficient NDP schemes is in progress.
Keywords
Cost function; Equations; Functional programming; Infinite horizon; Job shop scheduling; Linear programming; Optimal scheduling; Pulp manufacturing; Semiconductor device manufacture; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN
0-7803-9567-0
Type
conf
DOI
10.1109/CDC.2005.1582481
Filename
1582481
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