• DocumentCode
    3112731
  • Title

    Partial hardware partitioning: a new pseudo-exhaustive test implementation

  • Author

    Udell, Jon G., Jr. ; McCluskey, Edward J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    1000
  • Abstract
    A pseudoexhaustive-test implementation technique is presented which combines the advantages of hardware partitioning and sensitized partitioning, offering lower hardware overhead than hardware partitioning, and lower test-set generation complexity and higher fault coverage than sensitized partitioning
  • Keywords
    logic design; logic testing; fault coverage; hardware partitioning; logic design; logic testing; pseudo-exhaustive test implementation; sensitized partitioning; test-set generation; Circuit faults; Circuit testing; Combinational circuits; Contracts; Electrical fault detection; Fault detection; Hardware; Logic circuits; Logic testing; Multiplexing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207895
  • Filename
    207895
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3112731