Equivalent radiation source extraction method for system level EMI and RFI prediction

A novel IC component level radiation source extraction method is described in this paper. The extracted equivalent current source from the 2.5D full wave simulation is exported out for further 3D full wave system level EMI/RFI prediction. This approach solves high complexity computer systempsilas EMI/RFI prediction challenges. This methodology was demonstrated by using a commercial 2.5D solver to simulate board and package near field emissions during early product design phase. The example used was a 4 inch Intel CK505 GTEM board where measured magnetic field was correlated to simulation. A commercial 3D solver was used for next level simulation and correlation. The methodology shows potential to be a useful tool for predicting near field emission using basic package and board information.