• DocumentCode
    3114368
  • Title

    Identifying buried objects using the neural network approach

  • Author

    Mittra, R. ; Ji-fu Ma ; Wenhua Yu

  • Author_Institution
    Electromagn. Commun. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    4
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    2596
  • Abstract
    We present a neural network approach for detecting conducting anomalies, e.g., underground buried objects and those located in sedimentary layers in seafloors. The first step in this approach is to simulate the scattering from buried objects by using a suitable computational modeling tool. The electric and magnetic field values, thus computed, are then used as inputs to a neural network and the associated conductivities are treated as targets. The neural network is trained to associate the conductivity profiles with the computed field values. Finally, we demonstrate that a trained neural network can be used to estimate the conductivities and sizes of new objects, not originally employed to train the network.
  • Keywords
    buried object detection; electric fields; electrical conductivity; electrical engineering computing; electromagnetic wave scattering; finite difference time-domain analysis; inhomogeneous media; inverse problems; learning (artificial intelligence); magnetic fields; neural nets; oceanographic techniques; FDTD; buried object scattering; buried objects identification; computational modeling tool; conducting anomalies detection; conductivity profiles; electric field; inverse scattering; magnetic field; neural network approach; neural network training; object size estimation; seafloors; sedimentary layers; targets; trained neural network; Boundary conditions; Buried object detection; Computational modeling; Computer networks; Conductivity; Finite difference methods; Frequency; Neural networks; Sea floor; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789340
  • Filename
    789340