• DocumentCode
    311467
  • Title

    Ring oscillator using InAlAs/InGaAs/InP enhancement/depletion-mode high electron mobility transistor direct-coupled FET logic inverters

  • Author

    Cueva, G. ; Mahajan, A. ; Fay, P. ; Arafa, M. ; Adesida, I.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    The authors report the fabrication and characterization of E/D-mode 0.5 μm gate-length direct-coupled FET logic (DCFL) inverters, and an 11-stage ring oscillator with a 3-stage output buffer, based on these inverters. Testing of discrete 0.5 μm devices gave threshold voltages of 195 mV with a standard deviation of 9 mV for the E-HEMTs, and -365 mV with a standard deviation of 19 mV for the D-HEMTs. RF testing yields unity current gain cutoff frequencies (ft) of 70 GHz and 67 GHz for the E-HEMTs and D-HEMTs respectively. The inverters were tested for DC performance and the voltage transfer curve shows noise margins of 145 mV at supply voltages as low as 0.6 V. The ring oscillator was tested using a spectrum analyzer and shows propagation delays as low as 20.66 ps/stage, power dissipation as low as 120 μW/stage, and power delay products as low as 2.65 fJ/stage. The fabrication process, inverters, and ring oscillator are described in detail
  • Keywords
    HEMT integrated circuits; III-V semiconductors; aluminium compounds; direct coupled FET logic; field effect logic circuits; gallium arsenide; high electron mobility transistors; indium compounds; integrated circuit technology; logic gates; millimetre wave field effect transistors; -365 mV; 0.5 mum; 11-stage ring oscillator; 195 mV; 20.66 ps; 3-stage output buffer; 67 GHz; 70 GHz; D-HEMTs; DC performance; E-HEMTs; E/D-mode; InAlAs-InGaAs-InP; InAlAs/InGaAs/InP enhancement/depletion-mode HEMT DCFL inverters; InP; RF testing; direct-coupled FET logic; discrete device testing; fabrication process; noise margins; power delay products; power dissipation; propagation delays; spectrum analyzer; threshold voltage; unity current gain cutoff frequencies; voltage transfer curve; FETs; Fabrication; Indium compounds; Indium gallium arsenide; Indium phosphide; Inverters; Propagation delay; Ring oscillators; Testing; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600078
  • Filename
    600078