• DocumentCode
    3115041
  • Title

    EMC macro-modeling of CMOS inverter using LECCS-I/O model with additional current source

  • Author

    Iokibe, Kengo ; Ohsaki, Akihiro ; Toyota, Yoshitaka ; Koga, Ryuji ; Wada, Osami

  • Author_Institution
    Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Tsushimanaka
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The authors investigated an EMC macro-model of the CMOS logic inverter gate, named LECCS-I/O that consists of linear equivalent circuit and current sources. This paper modifies the macro-model by adding another current source to express the short-circuit current in the inverter. The macro-model was determined from SPICE calculations of impedance and power current by using a device model of an inverter IC. The modified model was tested with several load capacitances in SPICE simulation. The results showed that the macro-model predicts the power current with good accuracy in the range up to 3 GHz except for frequencies at which inductances of the package and of traces on printed circuit board and capacitance of the load caused resonances.
  • Keywords
    CMOS logic circuits; constant current sources; equivalent circuits; integrated circuit modelling; invertors; logic gates; printed circuits; short-circuit currents; CMOS logic inverter gate; EMC macromodeling; LECCS-I-O model; SPICE calculations; capacitance; current source; impedance; linear equivalent circuit; power current; printed circuit board; short-circuit current; CMOS logic circuits; Capacitance; Circuit testing; Electromagnetic compatibility; Equivalent circuits; Impedance; Integrated circuit modeling; Pulse inverters; SPICE; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652105
  • Filename
    4652105