DocumentCode
3115730
Title
Error identification and data recovery in MISR-based data compaction
Author
Sun, Xiaoling ; Tutak, Wes
Author_Institution
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
fYear
1997
fDate
20-22 Oct 1997
Firstpage
252
Lastpage
260
Abstract
This paper introduces a novel data recovery scheme for multiple data streams and multiple errors in MISR (multiple input shift register) based parallel data compaction. Utilizing existing BIST resources with an additional MISR, it is capable of identifying any number of errors in any two input data streams, and recovering the information bits lost during signature compaction
Keywords
VLSI; built-in self test; data compression; error detection; identification; integrated circuit testing; logic testing; shift registers; BIST resources; MISR-based data compaction; data recovery; error identification; multiple data streams; multiple errors; multiple input shift register; parallel data compaction; signature compaction; Automatic testing; Built-in self-test; Compaction; Computer errors; Fault diagnosis; Linear feedback shift registers; Polynomials; Proposals; Shift registers; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location
Paris
ISSN
1550-5774
Print_ISBN
0-8186-8168-3
Type
conf
DOI
10.1109/DFTVS.1997.628332
Filename
628332
Link To Document