DocumentCode
3115851
Title
Developing the mesoscale stress-strain curve to failure
Author
Iwamoto, Nancy
Author_Institution
Honeywell Specialty Materials, USA
fYear
2011
fDate
18-20 April 2011
Firstpage
42376
Lastpage
42558
Abstract
Developing the stress response using the molecular and mesoscale levels is fairly reliable during the initial strain. For instance, modulus is a property that can be established using these techniques and the continuity of scale suggests that both may be used to establish modulus for parameterizing a macroscale model when measured properties are unavailable. However, the latter part of the stress/strain response that helps to establish ties to crack propagation still needs attention. One problem that was previously found was questionable lack of void formation in crosslinked systems due to superficially clean adhesive separation in the simulations. One way to overcome this lack of voiding was to determine how to develop bond breakage criterion that would allow surfaces to develop. This paper discusses development and application of bond breakage, and the impact on the simulated stress/strain curves using mesoscale models.
Keywords
adhesive bonding; copper compounds; resins; stress-strain relations; Cu2O; adhesive separation; bond breakage; failure; mesoscale models; mesoscale stress-strain curve; Adhesives; Data models; Deformable models; Energy states; Plastics; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location
Linz
Print_ISBN
978-1-4577-0107-8
Type
conf
DOI
10.1109/ESIME.2011.5765759
Filename
5765759
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