• DocumentCode
    3115851
  • Title

    Developing the mesoscale stress-strain curve to failure

  • Author

    Iwamoto, Nancy

  • Author_Institution
    Honeywell Specialty Materials, USA
  • fYear
    2011
  • fDate
    18-20 April 2011
  • Firstpage
    42376
  • Lastpage
    42558
  • Abstract
    Developing the stress response using the molecular and mesoscale levels is fairly reliable during the initial strain. For instance, modulus is a property that can be established using these techniques and the continuity of scale suggests that both may be used to establish modulus for parameterizing a macroscale model when measured properties are unavailable. However, the latter part of the stress/strain response that helps to establish ties to crack propagation still needs attention. One problem that was previously found was questionable lack of void formation in crosslinked systems due to superficially clean adhesive separation in the simulations. One way to overcome this lack of voiding was to determine how to develop bond breakage criterion that would allow surfaces to develop. This paper discusses development and application of bond breakage, and the impact on the simulated stress/strain curves using mesoscale models.
  • Keywords
    adhesive bonding; copper compounds; resins; stress-strain relations; Cu2O; adhesive separation; bond breakage; failure; mesoscale models; mesoscale stress-strain curve; Adhesives; Data models; Deformable models; Energy states; Plastics; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
  • Conference_Location
    Linz
  • Print_ISBN
    978-1-4577-0107-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2011.5765759
  • Filename
    5765759