VLSI procurement and qualification: NASA/GSFC experience, issues and concerns

Author

Sharma, Ashok K.

Author_Institution

NASA, Goddard Space Flight Center, Greenbelt, MD, USA

fYear

1991

fDate

15-17 April 1991

Firstpage

109

Lastpage

113

Abstract

Describes the VLSI parts quality and reliability issued for NASA space flight use, particularly from a NASA/Goddard Space Flight Center (GSFC) perspective. A case history of four chip set gate arrays planned for use on a high speed flight data recorder, qualification effort based on MIL-M-38510 requirements, is discussed.<>

Keywords

VLSI; aerospace instrumentation; application specific integrated circuits; circuit reliability; logic arrays; quality control; Goddard Space Flight Center; MIL-M-38510; NASA space flight use; VLSI; chip set gate arrays; flight data recorder; parts quality; reliability; CMOS logic circuits; Microprocessors; Monitoring; NASA; Process control; Procurement; Qualifications; Space exploration; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Conference_Location

Atlantic City, NJ, USA

Type

conf

DOI

10.1109/VTEST.1991.208143

Filename

208143

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116442