• DocumentCode
    3116722
  • Title

    Probes for diagnosing EMC problems

  • Author

    Doren, Tom Van

  • Author_Institution
    Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A collection of slides from the author´s conference presentation is given. This paper presents the diagnostic measurement for electromagnetic compatibility.
  • Keywords
    electromagnetic compatibility; probes; clamp-on probes; electric field probes; electromagnetic compatibility; magnetic field probes; voltage probes; Area measurement; Coaxial cables; Current measurement; Electric variables measurement; Electromagnetic compatibility; Energy measurement; Frequency measurement; Impedance measurement; Probes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652194
  • Filename
    4652194
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116722