• DocumentCode
    3117250
  • Title

    Introduction to VCCI kit module EMI program An approach for module level EMI quantification

  • Author

    Sakurai, Akihisa ; Yamane, Hiroshi ; Nagasawa, Haruyoshi ; Yamada, Kojiro

  • Author_Institution
    IBM, Armonk, NY
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A collection of slides from the authors´ conference presentation is given.
  • Keywords
    electromagnetic interference; modules; EMI program; EMI quantification; VCCI kit module; module level; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; IEC standards; Integrated circuit measurements; Integrated circuit testing; Magnetic resonance; Magnetic semiconductors; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652221
  • Filename
    4652221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3117250