• DocumentCode
    311776
  • Title

    Epitaxially deposited SrVO3 conducting films by laser ablation and metal organic chemical vapor deposition

  • Author

    Ritums, D.L. ; Wu, N.J. ; Liu, D. ; Zhong, Q. ; Chen, Y.M. ; Zhang, X. ; Chou, P.C. ; Ignatiev, A.

  • Author_Institution
    Texas Center for Supercond., Houston Univ., TX, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    18-21 Aug 1996
  • Firstpage
    417
  • Abstract
    We have grown epitaxial thin films (100-200 nm) of SrVO3 with pulsed laser deposition and metal organic chemical vapor deposition on Si, YSZ, MgO, LaAlO3, and and SrTiO3 . These films range from insulating to semiconducting to metallic, depending on growth conditions. Resistivity has been measured with the standard four point method, and has been found to be as low as 1 μΩ-cm for SVO on Si with a YSZ buffer layer. This is comparable to 10 μΩ-cm for Pt. XRD studies have also been done to determine the crystal structure of the films
  • Keywords
    CVD coatings; X-ray diffraction; crystal structure; electrical resistivity; epitaxial layers; ferroelectric materials; ferroelectric thin films; pulsed laser deposition; strontium compounds; vapour phase epitaxial growth; 1 muohmcm; 100 to 200 nm; LaAlO3; MgO; Si; SrTiO3; SrVO3; XRD; Y2O3Zr2O3; YSZ buffer layer; crystal structure; epitaxially deposited SrVO3 conducting films; laser ablation; metal organic chemical vapor deposition; resistivity; standard four point method; Chemical lasers; Chemical vapor deposition; Insulation; Optical pulses; Organic chemicals; Pulsed laser deposition; Semiconductor films; Semiconductor lasers; Semiconductor thin films; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
  • Conference_Location
    East Brunswick, NJ
  • Print_ISBN
    0-7803-3355-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1996.602778
  • Filename
    602778