• DocumentCode
    3118868
  • Title

    Modeling and evaluation of error flow characteristics in the Nakagami fading channel

  • Author

    Lachman, A. ; Shmaryh, E. ; Kaufman, O.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    439
  • Lastpage
    442
  • Abstract
    The design of a data communication system using a channel with additive and multiplicative interference presents a rather difficult problem. The fading process is usually exponentially correlated, but have a variety of the probability density functions (PDF) (Nakagami, lognormal, gamma etc.). Therefore it is rather difficult to achieve analytical results on the estimation of different modems performance in such a channel. The only way to choose the modem properly consists of simulation of the so called coding channel including the modem and the continuous channel itself, i.e. practically the simulation of the error-flow corresponding to a certain pair of the modem and continuous channel with specific fading PDF. We consider a new approach to modeling of the coding channel based on the description of the fading process as a solution of a nonlinear stochastic differential equation with the required PDF and approximately exponential correlation
  • Keywords
    channel coding; correlation methods; differential equations; error analysis; fading channels; interference (signal); modems; probability; FSK coherent demodulation; Nakagami fading channel; PDF; additive interference; coding channel; continuous channel; data communication system; error flow characteristics; error-flow; exponentially correlated fading; modem performance; multiplicative interference; nonlinear stochastic differential equation; probability density functions; simulation; AWGN; Computer errors; Data communication; Differential equations; Fading; Interference; Modems; Probability density function; Stochastic processes; Toxicology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the
  • Conference_Location
    Tel-Aviv
  • Print_ISBN
    0-7803-5842-2
  • Type

    conf

  • DOI
    10.1109/EEEI.2000.924463
  • Filename
    924463