DocumentCode
3119735
Title
Wavelet analysis for EEG feature extraction in deception detection
Author
Merzagora, Anna Caterina ; Bunce, Scott ; Izzetoglu, Meltem ; Onaral, Banu
Author_Institution
Sch. of Biomed. Eng., Drexel Univ., Philadelphia, PA
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
2434
Lastpage
2437
Abstract
Deception detection has important clinical and legal implications. However, the reliability of methods for the discrimination between truthful and deceptive responses is still limited. Efforts to improve reliability have examined measures of central nervous system function such as EEG. However, EEG analyses based on either time- or frequency-domain parameters have had mixed results. Because EEG is a nonstationary signal, the use of joint time-frequency features may yield more reliable results for detecting deception. The goal of this study was to investigate the feasibility of deception detection based on EEG features extracted through wavelet transformation. EEG was recorded from 4 electrode sites (F3, F4, F7, F8) during a modified version of the Guilty Knowledge Test (GKT) in 5 subjects. Wavelet analysis revealed significant differences between deceptive and truthful responses. These differences were detected in features whose frequency range roughly corresponds to the EEG beta rhythm and within a time window which coincides with the P300 component. These preliminary results indicate that joint time-frequency EEG features extracted through wavelet analysis may provide a more reliable method for detecting deception than standard ERPs
Keywords
electroencephalography; feature extraction; medical signal processing; neurophysiology; time-frequency analysis; wavelet transforms; EEG beta rhythm; EEG feature extraction; P300 component; central nervous system function; deception detection; frequency-domain parameter; guilty knowledge test; nonstationary signal; time-domain parameter; time-frequency feature; wavelet analysis; Central nervous system; Electrodes; Electroencephalography; Feature extraction; Frequency domain analysis; Law; Legal factors; Testing; Time frequency analysis; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260247
Filename
4462286
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