• DocumentCode
    3120023
  • Title

    Plasma-resonant THz detection with HEMTs

  • Author

    Mateos, J. ; Marinchio, H. ; Palermo, C. ; Varani, L. ; Gonzá, T.

  • Author_Institution
    Dept. de Fis. Aplic., Univ. de Salamanca, Salamanca, Spain
  • fYear
    2010
  • fDate
    May 31 2010-June 4 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work, by means of Monte Carlo simulations we analyze the dependence of the DC drain current value in a 80 nm-gate InAlAs/InGaAs HEMTs on the frequency of a sinusoidal signal superimposed to the DC gate bias. Interestingly, a resonant peak appears in the drain current response, which lies in the THz frequency range, in good agreement with recent experiments made on similar devices. Moreover, the frequency of the resonant peak is dependent on the length of the source-gate region, but independent of the length of the drain-gate region, thus indicating that the source-gate region acts as the plasma wave cavity leading to the resonant detection of THz radiation in HEMTs.
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; plasma waves; terahertz waves; DC drain current; DC gate bias; HEMT; InAlAs-InGaAs; Monte Carlo simulations; drain current response; drain-gate region; plasma wave cavity; plasma-resonant THz detection; sinusoidal signal frequency; size 80 nm; source-gate region; HEMTs; Indium compounds; Indium gallium arsenide; MODFETs; Plasma simulation; Plasma waves; Radiation detectors; Resonance; Resonant frequency; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide & Related Materials (IPRM), 2010 International Conference on
  • Conference_Location
    Kagawa
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4244-5919-3
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2010.5516389
  • Filename
    5516389