• DocumentCode
    3120681
  • Title

    Capacity and productivity modeling for research laboratories using a representative product load

  • Author

    Kuhl, Michael E. ; Hirschman, Karl D. ; Ramamurthi, Vikram ; Laubisch, Gregory R.

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Rochester Inst. of Technol., NY, USA
  • fYear
    2004
  • fDate
    4-6 May 2004
  • Firstpage
    157
  • Lastpage
    161
  • Abstract
    Efficient use of R&D laboratory resources including fabrication and metrology tools, analytical equipment, and operators and technicians is critical to product development, time to market, and ultimately company success. Capacity and productivity modeling in R&D fabs presents significant challenges and is not usually well understood. Simulation modeling can provide an accurate representation of the R&D fab that can be used to investigate the operational aspects of the fab and provide a quantitative statistical analysis of fab performance measures. A simulation study of the Semiconductor & Microsystems Fabrication Laboratory (SMFL) at the Rochester Institute of Technology (RIT) is used to present a case study on this methodology. A baseline CMOS process is used as the representative product load, which accounts for the variety of research activities in progress in the SMFL. The fab performance is assessed by the cycle time, WIP, and throughput of representative load lots.
  • Keywords
    CMOS integrated circuits; capacity planning (manufacturing); electronics industry; product development; productivity; semiconductor device manufacture; statistical analysis; CMOS process; R and D laboratory resources; Rochester Institute of Technology; capacity modeling; company success; metrology tools; product development; productivity modeling; quantitative statistical analysis; representative product load; semiconductor and microsystems fabrication laboratory; time to market; Analytical models; CMOS technology; Fabrication; Laboratories; Metrology; Product development; Productivity; Research and development; Statistical analysis; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop
  • Print_ISBN
    0-7803-8312-5
  • Type

    conf

  • DOI
    10.1109/ASMC.2004.1309556
  • Filename
    1309556