• DocumentCode
    3121474
  • Title

    Effect of slow wave structure length on microwave emission from a high-power backward-wave oscillator

  • Author

    Yatsuzuka, M. ; Sumitani, Y. ; Hashimoto, Yo ; Nobuhara, Shohei

  • Author_Institution
    Dept. of Electr. Eng., Himeji Inst. of Technol., Hyogo, Japan
  • fYear
    1996
  • fDate
    3-5 June 1996
  • Firstpage
    289
  • Abstract
    Summary form only given. Effect of slow wave structure length on microwave emission from a backward-wave oscillator (BWO) with an intense relativistic electron beam was studied experimentally. The slow wave structure of a circular waveguide with square-wave wall of 57 periods maximum is constructed from individual rings for each period, then its length can be easily changed in any period. The inner and outer radii of the waveguide structure are 1.4 cm and 2.0 cm, respectively. The length of each ring, or one period, is fixed in 0.9 cm, while the length of inner radius section can be exchanged in different length. An annular electron beam with the energy of 300 kV, current of 2 kA, duration of 50 ns, and outer radius of 0.8 cm propagates in the axial magnetic field of 1.5 kG.
  • Keywords
    backward wave oscillators; circular waveguides; electron beams; magnetic fields; relativistic electron beam tubes; slow wave structures; 1.5 kG; 2 kA; 300 kV; BWO; annular electron beam; axial magnetic field; circular waveguide; high-power backward-wave oscillator; intense relativistic electron beam; microwave emission; slow wave structure length; square-wave wall; Cities and towns; Distortion measurement; Educational institutions; Electron beams; Electronics industry; Industrial electronics; Microwave oscillators; Microwave propagation; Microwave technology; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3322-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1996.551646
  • Filename
    551646