Empirical comparison of software-based error detection and correction techniques for embedded systems

Author

Ong, Royan H L ; Pont, Michael J.

Author_Institution

Dept. of Eng., Leicester Univ., UK

fYear

2001

fDate

2001

Firstpage

230

Lastpage

235

Abstract

“Function Tokens” and “NOP Fills” are two methods proposed by various authors to deal with instruction pointer corruption in microcontrollers, especially in the presence of high electromagnetic interference levels. An empirical analysis to assess and compare these two techniques is presented in this paper. Two main conclusions are drawn: [1] NOP Fills are a powerful technique for improving the reliability of embedded applications in the presence of EMI, and [2] the use of function tokens can lead to a reduction in overall system reliability

Keywords

electromagnetic interference; embedded systems; error correction; error detection; microcontrollers; software fault tolerance; EMI; embedded systems; empirical comparison; error correction; function tokens; high electromagnetic interference levels; microcontrollers; reliability; software-based error detection; system reliability; Application software; Automotive engineering; Consumer electronics; Electrical equipment industry; Electromagnetic interference; Embedded system; Error correction; Microcontrollers; Power system reliability; Student members;

fLanguage

English

Publisher

ieee

Conference_Titel

Hardware/Software Codesign, 2001. CODES 2001. Proceedings of the Ninth International Symposium on

Conference_Location

Copenhagen

Print_ISBN

1-58113-364-2

Type

conf

DOI

10.1109/HSC.2001.924681

Filename

924681