• DocumentCode
    3125768
  • Title

    Wavelet denoising technique for high-resolution CTD data. Characterization of turbulent oceanic flow

  • Author

    Piera, J. ; Quesada, R. ; Manuel-Lazaro, A. ; Del, R.J. ; Panahi, S. Shariat ; Olivar, G.

  • Author_Institution
    Tech. Univ. of Catalonia, Castelldefels, Spain
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    1468
  • Abstract
    The analysis of high-resolution CTD vertical profiles (conductivity, temperature and depth) is a common method for characterizing environmental turbulent fluid dynamics. One of the objectives in analyzing high-resolution CTD profiles is to identify turbulent regions (patches) within the flow. Due to the instrumental noise of CTD measurements, the previous methods for turbulent patch identification, reported in the literature, are usually unable to identify patches at low-density gradient. Here we proposed a new method that significantly improves patch detection at low-density gradients. The method is based on a wavelet-denoising procedure and a theoretical analysis of the error in data obtained from the CTD sensors. The high percentage of validating patches, obtained in numerical and field tests, indicates that the method is a powerful tool for fluid dynamics characterization, and can be applied in a wide range of environmental monitoring applications.
  • Keywords
    environmental factors; fluid dynamics; oceanographic techniques; signal denoising; spatial variables measurement; temperature sensors; turbulence; wavelet transforms; conductivity; depth; environmental monitoring; environmental turbulent fluid dynamics; high-resolution CTD data; low-density gradients; patch detection; temperature; turbulent oceanic flow; vertical profiles; wavelet denoising; Conductivity; Error analysis; Fluid dynamics; Instruments; Noise measurement; Noise reduction; Ocean temperature; Sea measurements; Wavelet analysis; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2004. Proceedings of IEEE
  • Print_ISBN
    0-7803-8692-2
  • Type

    conf

  • DOI
    10.1109/ICSENS.2004.1426464
  • Filename
    1426464