DocumentCode
3127052
Title
Accuracy of QT Measurement in the EASI-derived 12-lead ECG
Author
Martinez, Juan Pablo ; Laguna, Pablo ; Olmos, Salvador ; Pahlm, Olle ; Petersson, Jonas ; Sornmo, Leif
Author_Institution
Commun. Technol. Group, Zaragoza Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
3986
Lastpage
3989
Abstract
The purpose of this study is to assess QT interval measurements from the EASI 12-lead ECG as compared to the standard 12-lead ECG. The QT interval was automatically measured in simultaneously recorded standard and EASI 12-lead ECGs, using a validated wavelet-based delineator. The agreement between the two sets of measurements was quantified both on a lead-by-lead basis and a multilead basis. The results show an acceptable agreement between QT measurements in the two lead systems, with correlation coefficients (CC) 0.91-0.98 depending on the lead. Standard deviations range from 9.2 ms to 26.4 ms depending on the selected lead. In a few patients large inter-system differences were found, mainly due to different T wave morphologies. Using a multilead delineation, QT intervals were considerably more stable than single-lead measurements and resulted in a much better agreement between the two lead systems (CC: 0.98, QT difference: 1.1 msplusmn9.8 ms). Thus, EASI-derived 12-lead ECG may be used for reliable QT monitoring when the multilead delineation approach is adopted
Keywords
biomedical electrodes; biomedical measurement; discrete wavelet transforms; electrocardiography; medical signal detection; 12-lead ECG; EASI; QT interval measurement; correlation coefficients; discrete wavelet transforms; lead-by-lead basis analysis; multilead basis analysis; multilead delineation approach; wavelet-based delineator; Cities and towns; Discrete wavelet transforms; Drugs; Electrocardiography; Electrodes; Heart rate interval; Hospitals; Measurement standards; Monitoring; Myocardium;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259718
Filename
4462673
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